60V, 80A, 3.8m鈩?/div>
Features
鈥?r
DS(ON)
= 3.5m鈩?(Typ.), V
GS
= 10V, I
D
= 80A
鈥?Q
g
(tot) = 95nC (Typ.), V
GS
= 10V
鈥?Low Miller Charge
鈥?Low Q
RR
Body Diode
鈥?UIS Capability (Single Pulse and Repetitive Pulse)
鈥?Qualified to AEC Q101
Formerly developmental type 82584
Applications
鈥?Motor / Body Load Control
鈥?ABS Systems
鈥?Powertrain Management
鈥?Injection Systems
鈥?DC-DC converters and Off-line UPS
鈥?Distributed Power Architectures and VRMs
鈥?Primary Switch for 12V and 24V systems
DRAIN
(FLANGE)
SOURCE
DRAIN
SOURCE
DRAIN
GATE
GATE
D
G
DRAIN
(FLANGE)
TO-220AB
FDP SERIES
TO-262AB
FDI SERIES
S
MOSFET Maximum Ratings
T
C
= 25擄C unless otherwise noted
Symbol
V
DSS
V
GS
Drain to Source Voltage
Gate to Source Voltage
Drain Current
I
D
Continuous (T
C
< 151
o
C, V
GS
= 10V)
Continuous (T
amb
= 25 C, V
GS
= 10V, with R
胃JA
= 62 C/W)
Pulsed
E
AS
P
D
T
J
, T
STG
Single Pulse Avalanche Energy (Note 1)
Power dissipation
Derate above 25 C
Operating and Storage Temperature
o
o
o
Parameter
Ratings
60
鹵20
80
17
Figure 4
625
310
2.07
-55 to 175
Units
V
V
A
A
A
mJ
W
W/
o
C
o
C
Thermal Characteristics
R
胃JC
R
胃JA
Thermal Resistance Junction to Case TO-220, TO-262
Thermal Resistance Junction to Ambient TO-220, TO-262 (Note 2)
0.48
62
o
o
C/W
C/W
This product has been designed to meet the extreme test conditions and environment demanded by the automotive
industry. For a copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality
systems certification.
漏2002 Fairchild Semiconductor Corporation
FDP038AN06A0 / FDI038AN06A0 Rev. A1