鈥?/div>
C
rss
<1.0pF
PIN CONFIGURATION
NOTE:
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device. These are
stress ratings only and functional operation of the device at these or
any other conditions above those indicated in the operational sections
of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
ORDERING INFORMATION
Part
5000
G
D S
Package
Temperature Range
-55
o
C to +135
o
C
-55
o
C to +135
o
C
2N5484-86 Plastic TO-92
X2N5484-86 Sorted chips in Carriers
ELECTRICAL CHARACTERISTICS
(T
A
= 25
o
C unless otherwise specified)
SYMBOL
I
GSS
BV
GSS
V
GS(off)
I
DSS
g
fs
g
os
Re
(yfs)
Re
(yos)
Re
(yis)
C
iss
C
rss
C
oss
PARAMETER
Gate Reverse Current
Gate-Source Breakdown Voltage
Gate-Source Cutoff Voltage
Saturation Drain Current
Common-Source Forward Transconductance
Common-Source Output Conductance
Common-Source Forward
Transconductance (Note 2)
Common-Source Output
Conductance (Note 2)
Common-Source Input Conductance (Note 2)
Common-Source Input Capacitance (Note 2)
Common-Source Reverse
Transfer Capacitance (Note 2)
Common-Source Output Capacitance (Note 2)
2500
3000
75
100
100
1000
5.0
1.0
2.0
5.0
1.0
2.0
1000
5.0
1.0
2.0
pF
f = 1MHz
100
V
DS
= 15V, V
GS
= 0
3500
碌S
-25
-0.3
1.0
-3.0
5.0
50
2N5484
-1.0
-200
-25
-0.5
4.0
-4.0
10
60
2N5485
-1.0
-200
-25
-2.0
8.0
-6.0
20
75
2N5486
-1.0
-200
MIN MAX MIN MAX MIN MAX
UNITS
nA
V
mA
TEST CONDITIONS
V
GS
= -20V, V
DS
= 0
T
A
= 100
o
C
I
G
= -1碌A(chǔ), V
DS
= 0
V
DS
= 15V, I
D
= 10nA
V
DS
= 15V, V
GS
= 0 (Note 1)
f = 1kHz
f = 100MHz
f = 400MHz
f = 100MHz
f = 400MHz
f = 100MHz
f = 400MHz
3000 6000 3500 7000 4000 8000
CALOGIC
1
2
