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Multiplexers and Low Noise Amplifiers
PIN CONFIGURATION
APPLICATIONS
ORDERING INFORMATION
Part
TO-18
Package
Hermetic TO-18
Sorted Chips in Carriers
Temperature Range
-55
o
C to +175
o
C
-55
o
C to +175
o
C
2N4338-41
X2N4338-41
G,C
5010
D
S
ELECTRICAL CHARACTERISTICS
(T
A
= 25
o
C unless otherwise specified)
SYMBOL
I
GSS
BV
GSS
V
GS(off)
I
D(off)
I
DSS
g
fs
g
os
r
DS(on)
C
iss
C
rss
PARAMETER
Gate Reverse Current
2N4338
2N4339
2N4340
2N4341
UNITS
MIN MAX MIN MAX MIN MAX MIN MAX
-0.1
-0.1
-0.1
-0.1
nA
T
A
= 150
o
C
-50
-0.3
-1
0.05
(-5)
0.2
0.6
0.5
-0.1
-50
-0.6
-1.8
0.05
(-5)
1.5
1.2
-0.1
-50
-1
-3
0.05
(-5)
3.6
3
-0.1
-50
-2
-6
0.07
(-10)
9
-0.1
碌A
V
nA
(V)
mA
碌S
ohm
pF
TEST CONDITIONS
V
GS
= -30V, V
DS
= 0
I
G
= -1碌A, V
DS
= 0
V
DS
= 15V, I
D
= 0.1碌A
V
DS
= 15V,
V
GS
= ( )
V
DS
= 15V, V
GS
= 0
V
DS
= 15V,
V
GS
= 0
V
DS
= 0, I
DS
= 0
V
DS
= 15V,
V
GS
= 0 (Note 1) f = 1MHz
V
DS
= 15V,
V
GS
= 0
R
gen
= 1meg,
BW = 200Hz
Gate-Source Breakdown Voltage
Gate-Source Cutoff Voltage
Drain Cutoff Current
Saturation Drain Current (Note 2)
Common-Source Forward
Transconductance (Note 2)
Common-Source Output Conductance
Drain-Source ON Resistance
Common-Source Input Capacitance
Common-Source Reverse Transfer
Capacitance
Noise Figure (Note 1)
600 1800 800 2400 1300 3000 2000 4000
5
2500
7
3
15
1700
7
3
30
1500
7
3
60
800
7
3
f = 1kHz
NF
1
1
1
1
dB
f = 1kHz
NOTES: 1.
For design reference only, not 100% tested.
2.
Pulse test duration 2ms (non-JEDEC Condition).
1
