3.
鈫?/div>
0 V
Remark
Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately
degrade the device operation. Steps must be taken to stop generation of static electricity as much as
possible, and quickly dissipate it once, when it has occurred.
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Document No.
G15983EJ1V0DS00 (1st edition)
Date Published November 2002 NS CP(K)
Printed in Japan
2002