3.
鈫?/div>
0 V
Caution Strong electric field, when exposed to this device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred.
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confirm that this is the latest version.
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Document No. G16621EJ1V0DS00 (1st edition)
Date Published January 2004 NS CP(K)
Printed in Japan
2003