鈥?/div>
2 Standard-Resolution Pins
鈥?High-Resolution Share Feature (XOR)
鈥?HET RAM (64-Instruction Capacity)
10-Bit Multi-Buffered ADC (MibADC)
16-Channel
鈥?64-Word FIFO Buffer
鈥?Single- or Continuous-Conversion Modes
鈥?1.55 碌s Minimum Sample and Conversion
Time
鈥?Calibration Mode and Self-Test Features
Eight External Interrupts
Flexible Interrupt Handling
11 Dedicated GIO Pins, 1 Input-Only GIO Pin,
and 38 Additional Peripheral I/Os
External Clock Prescale (ECP) Module
鈥?Programmable Low-Frequency External
Clock (CLK)
On-Chip Scan-Base Emulation Logic, IEEE
Standard 1149.1
(1)
(JTAG) Boundary-Scan
Logic
100-Pin Plastic Low-Profile Quad Flatpack (PZ
Suffix)
(1)
The test-access port is compatible with the IEEE Standard
1149.1-1990, IEEE Standard Test-Access Port and Boundary
Scan Architecture. Boundary scan is not supported on this
device.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
ARM7TDMI is a trademark of Advanced RISC Machines (ARM) Limited.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright 漏 2005, Texas Instruments Incorporated