SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs
August 2002
SCAN16512
Low Voltage Universal 16-bit IEEE 1149.1 Bus
Transceiver with TRI-STATE Outputs
General Description
The SCAN16512 is a high speed, low-power universal bus
transceiver featuring data inputs organized into two 8-bit
bytes with output enable and latch enable control signals.
This function is configurable as a D-type Latch or Flip-Flop,
and can operate in transparent, latched, or clocked mode.
This device is compliant with IEEE 1149.1 Standard Test
Access Port and Boundary Scan Architecture with the incor-
poration of the defined boundary-scan test logic and test
access port consisting of Test Data Input (TDI), Test Data
Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and
Test Reset (TRST).
Features
IEEE 1149.1 (JTAG) Compliant
2.7V to 3.6V V
CC
Operation
TRI-STATE outputs for bus-oriented applications
Dual byte-wide data for bus applications
Power down high Impedance inputs and outputs
Optional Bus Hold on data inputs eliminates the need
for external pullup/pulldown resistors (SCANH16512,
SCANH162512 versions)
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Optional 25鈩?series resistors in outputs to minimize
noise and eliminate termination resistors (SCAN162512,
SCANH162512 versions)
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Supports live insertion/withdrawal
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Includes CLAMP and HIGHZ instructions
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Block Diagram
20026602
漏 2002 National Semiconductor Corporation
DS200266
www.national.com