SCAN18245T Non-Inverting Transceiver with TRI-STATE Outputs
September 1998
SCAN18245T
Non-Inverting Transceiver with TRI-STATE
廬
Outputs
General Description
The SCAN18245T is a high speed, low-power bidirectional
line driver featuring separate data inputs organized into dual
9-bit bytes with byte-oriented output enable and direction
control signals. This device is compliant with IEEE 1149.1
Standard Test Access Port and Boundary Scan Architecture
with the incorporation of the defined boundary-scan test
logic and test access port consisting of Test Data Input (TDI),
Test Data Out (TDO), Test Mode Select (TMS), and Test
Clock (TCK).
Features
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IEEE 1149.1 (JTAG) Compliant
Dual output enable control signals
TRI-STATE outputs for bus-oriented applications
9-bit data busses for parity applications
Reduced-swing outputs source 24 mA/sink 48 mA
Guaranteed to drive 50鈩?transmission line to TTL input
levels of 0.8V and 2.0V
TTL compatible inputs
25 mil pitch Cerpack package
Includes CLAMP and HIGHZ instructions
Available as Known Good Die
Standard Microcircuit Drawing (SMD) 5962-9311501
Connection Diagram
Pin Names
B1
(0鈥?)
A2
(0鈥?)
B2
(0鈥?)
G1, G2
DIR1, DIR2
Description
Side B1 Inputs or TRI-STATE Outputs
Side A2 Inputs or TRI-STATE Outputs
Side B2 Inputs or TRI-STATE Outputs
Output Enable Pins
Direction of Data Flow Pins
DS100320-1
Pin Names
A1
(0鈥?)
Description
Side A1 Inputs or TRI-STATE Outputs
TRI-STATE
廬
is a registered trademark of National Semiconductor Corporation.
漏 1998 National Semiconductor Corporation
DS100320
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