鈥?/div>
LVCMOS, LVTTL compatible
藴
Tri-state option available
Output Waveform
CMOS
T
r
1 Level
80%V
DD
50%V
DD
20%V
DD
0 Level
GND
SYMMETRY
T
f
V
DD
Supply Current:
32 to 70 MHz:
70+ to 125 MHz:
Output Drive:
Symmetry:
50mA max, 35mA max @ 3.3V
65mA max, 35mA max @ 3.3V
Rise & Fall Times:
Logic 0:
Logic 1:
Load:
Jitter:
Pull Characteristics:
Input Impedance:
Frequency Response (-3dB):
Pullability:
Control Voltage:
Transfer Function:
Linearity:
Center Control Voltage:
Phase noise:
3.3V: 45/55% max @ 50% V
DD
for 0 to 70擄C,
3.3V: 40/60% max @ 50% V
DD
for -40 to +85擄C
5.0V: 45/55% max @ 50% V
DD or
40/60% max @ 1.4V TTL level
4ns max: 20% to 80% V
DD
1.5ns max: 0.5V to 2.5V @ 5V TTL only
0.5V max @ 5V or 20% V
DD
max @ 3.3V
2.5V min @ 5V or 80% V
DD
min @ 3.3V
5V: 5TTL or 50pF, 32 to 50 MHz
5V: 5TTL or 30pF 50+ to 125 MHz
3.3V: 30pF up to 80 MHz, 95鈩?AC up to 125 MHz
20ps max RMS period jitter
50K鈩?min
50 kHz min
鹵25, 鹵50, 鹵75, 鹵100 ppm APR*
0.5 to 4.5 V @ 5V or 0.3 to 3.0V @ 3.3V
Frequency increases when Control Voltage increases
5% or 10% max
2.5V @ 5V, 1.65V @ 3.3V
-95 dbc typ / Hz @ 100Hz
-110 dbc typ / Hz @ 1kHz
-100 dbc typ / Hz @ 10kHz
Mechanical:
Shock:
Solderability:
Terminal Strength:
Vibration:
Solvent Resistance:
Resistance to Soldering Heat:
MIL-STD-883, Method 2002, Condition B
MIL-STD-883, Method 2003
MIL-STD-202, Method 211, Conditions B2
MIL-STD-883, Method 2007, Condition A
MIL-STD-202, Method 215
MIL-STD-202, Method 210, Condition A, B or C
( I or J for Gull Wing )
Environmental:
Gross Leak Test:
Fine Leak Test:
Thermal Shock:
Moisture Resistance:
MIL-STD-883,
MIL-STD-883,
MIL-STD-883,
MIL-STD-883,
Method
Method
Method
Method
1014, Condition C
1014, Condition A2
1011, Condition A
1004
*
APR = (VCXO Pull relative to specified Output Frequency)
鈥?/div>
(VCXO Frequency Stability)
NOTE: APR is inclusive of Aging
DS-162
REV E
SaRonix
141 Jefferson Drive 鈥?Menlo Park, CA 94025 鈥?USA 鈥?650-470-7700 鈥?800-227-8974 鈥?Fax 650-462-9894
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