鈭?/div>
-Drift Series
FEATURES
D
D
D
D
D
D
D
D
LOW OFFSET VOLTAGE: 5碌V (max)
ZERO DRIFT: 0.05碌V/擄C max
QUIESCENT CURRENT: 750碌A(chǔ) (max)
SINGLE-SUPPLY OPERATION
LOW BIAS CURRENT: 200pA (max)
SHUTDOWN
MicroSIZE
PACKAGES
WIDE SUPPLY RANGE: 2.7V to 12V
DESCRIPTION
The OPA734 and OPA735 series of CMOS operational
amplifiers use auto-zeroing techniques to simultaneously
provide low offset voltage (5碌V max) and near-zero drift
over time and temperature. These miniature, high-preci-
sion, low quiescent current amplifiers offer high input
impedance and rail-to-rail output swing within 50mV of the
rails. Either single or bipolar supplies can be used in the
range of +2.7V to +12V (鹵1.35V to
鹵6V).
They are
optimized for low-voltage, single-supply operation.
The OPA734 family includes a shutdown mode. Under
logic control, the amplifiers can be switched from normal
operation to a standby current that is 9碌A(chǔ) (max) and the
output placed in a high-impedance state.
The single version is available in the MicroSIZE SOT23-5
(SOT23-6 for shutdown version) and the SO-8 packages.
The dual version is available in the MSOP-8 and SO-8
packages (MSOP-10 only for the shutdown version). All
versions are specified for operation from 鈭?0擄C to +85擄C.
APPLICATIONS
D
D
D
D
D
D
TRANSDUCER APPLICATIONS
TEMPERATURE MEASUREMENTS
ELECTRONIC SCALES
MEDICAL INSTRUMENTATION
BATTERY-POWERED INSTRUMENTS
HANDHELD TEST EQUIPMENT
V
REF
= 15V
REF102
10V
R
1
1k鈩?/div>
G=1+2
R
3
R
G
C
1
1nF
1/2
OP A2735
R
3
10k鈩?/div>
C
4
1nF
C
2
10nF
C
4
1nF
R
3
10k鈩?/div>
R
G
R
2
1k鈩?/div>
C
3
1nF
1/2
OP A2735
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Products
conform to specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all parameters.
Copyright
錚?/div>
2003-2005, Texas Instruments Incorporated
www.ti.com
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