Quality and Continuous
Improvement
Reliability Qualification Report
Device Qualification
Date: 10/16/2002
PCN:
Laura Rivers
Reliability Engineer
602 244 5474
Scott Savage
Reliability Manager
602 244 4848
1) Introduction:
Qualification of NUF2221W1T2 series of devices designed for applications requiring Line Termination, EMI Filtering and ESD
Protection.These are intented for use in upstream USB ports, Cellular phones, Wireless equipment and computer applications.
Offering an integrated solution, offering better ESD protection than available from a discete implemetation because of reduced
parasitic inductances, in a small package (SC88/SOT363) reducing PCB space and cost.
ESD Ratings: Jedec MM Class C, Jedec HBM 3B.
Compliant with IEC61000-4-2 (Level 4) 8KV (contact) 15KV (air)
2) Device Description:
Qual ID
1564
Device
NUF2221W1T2
Line Source
ZLU22N
Parent Tech
ZENER
Technology
ZENER
Package
SC88/SOT363
Polarity
PN
Wafer Fab Site
ISMF
Assembly Site
SBN
Final Test Site
AIT BATAM, IDN
Reliability Lab
SBN
Max. Current
100mA
Die Size
670 X 500
Seremban, Malaysia
Seremban, Malaysia
Batam, Indonesia
Seremban, Malaysia
Max. Voltage
7V
Flag Size
1.1mm X 0.625mm
Related Qualification Report(s):
This series of devices is qualified by similarity based upon the NZMM7V04T4, rel report # 0450 , for die technology and the
NL27WZU04DFT2, rel report# 1242, for package technology.
Full characterization of the NUF2221W1T2 has also been
completed.
NUF2221W1T2_1564_2002.pdf
Product Reliability Engineering Services
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