NTE3881
Integrated Circuit
NMOS, Parallel I/O Interface (PIO), 4MHz
Description:
The NTE3881 Parallel I/O Circuit (PIO) is a programmable, two port device which provides a TTL
compatible interface between peripheral devices and the NTE3880. The Central Processing Unit
(CPU) can configure the NTE3881 to interface with a wide range of peripheral devices with no other
external logic required. Typical peripheral devices that are fully compatible with the NTE3881 include
most keyboard, paper tape readers and punches, printers, PROM programmers, etc. The NTE3881
utilizes N channel silicon gate depletion load technology and is packaged in a 40鈥揕ead DIP type package.
Features:
D
Two Independent 8鈥揃it Bidirectional Peripheral Interface Ports with 鈥淗andshake鈥?Data Transfer
Control
D
Interrupt Driven 鈥淗andshake鈥?for Fast Response
D
Any One of Four Distinct Modes of Operation may be Selected for a Port, including:
Byte Output
Byte Input
Byte Bidirectional Bus (Available on Port A Only)
Bit Control Mode
D
All with Interrupt Controlled Handshake
D
Daisy Chain Priority Interrupt Logic Included to Provide for Automatic Interrupt Vectoring without
External Logic
D
Eight Outputs are Capable of Driving Darlington Transistors
D
All Inputs and Outputs Fully TTL Compatible
D
Single 5 Volt Supply and Single Phase Clock Required
Absolute Maximum Ratings:
Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0擄 to +70擄C
Storage Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 鈥?5擄 to +150擄C
Voltage On Any Pin With Respect to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 鈥?.3V to +7V
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6W
Note 1. Stresses above those listed under 鈥淎bsolute Maximum Ratings鈥?may cause permanent
damage to the device. This is a stress rating only functional operation of the device at these
or any other condition above those indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods may
affect device reliability.
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