K9K2G08U0M-VCB0,VIB0,FCB0,FIB0
K9K2G08Q0M-YCB0,YIB0,PCB0,PIB0
K9K2G08U0M-YCB0,YIB0,PCB0,PIB0
K9K2G16Q0M-YCB0,YIB0,PCB0,PIB0
K9K2G16U0M-YCB0,YIB0,PCB0,PIB0
FLASH MEMORY
Document Title
256M x 8 Bit / 128M x 16 Bit
NAND Flash Memory
Revision History
Revision No
0.0
0.1
History
1. Initial issue
1.
IO
L(R/B) of 1.8V device is changed.
-min. Value: 7mA -->3mA
-typ. Value: 8mA -->4mA
Draft Date
Sep. 19.2001
Nov. 5. 2001
Remark
Advance
0.2
1. 5th cycle of ID is changed
: 40h --> 44h
Jan. 23.2002
0.3
1. Add WSOP Package Dimensions.
May. 29.2002
0.4
1. Max Icc value of 1.8V/3.3V device is changed.
- Max. value Icc1,Icc2,Icc3: 20mA --> 30mA (3.3V device)
- Max. value Icc1,Icc2,Icc3: 15mA --> 20mA (1.8V device)
Sep. 12.2002
0.5
1. Add the Rp vs tr ,tf & Rp vs ibusy graph for 1.8V device (Page 35)
2. Add the data protection Vcc guidence for 1.8V device - below about
1.1V. (Page 36)
Nov. 22.2002
0.6
0.7
The min. Vcc value 1.8V devices is changed.
K9K2GXXQ0M : Vcc 1.65V~1.95V --> 1.70V~1.95V
Pb-free Package is added.
K9K2G08U0M-FCB0,FIB0
K9K2G08Q0M-PCB0,PIB0
K9K2G08U0M-PCB0,PIB0
K9K2G16U0M-PCB0,PIB0
K9K2G16Q0M-PCB0,PIB0
Errata is added.(Front Page)-K9K2GXXQ0M
tWC tWP tWH tRC tREH tRP tREA tCEA
Specification
45 25 15 50 15 25 30
45
Relaxed value 80 60 20 60 80 60 60
75
1. The 3rd Byte ID after 90h ID read command is don鈥?cared.
t
The 5th Byte ID after 90h ID read command is deleted.
1. Added Addressing method for program operation
Mar. 6.2003
Mar. 13.2003
0.8
Mar. 17.2003
0.9
1.0
Apr. 9. 2003
Jan. 27. 2004
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the
right to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you
have any questions, please contact the SAMSUNG branch office near your office.
1