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IRHNJ53130 Datasheet

  • IRHNJ53130

  • RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-0.5)

  • 130.47KB

  • 8頁

  • IRF

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PD - 93754E
RADIATION HARDENED
POWER MOSFET
SURFACE MOUNT (SMD-0.5)
Product Summary
Part Number Radiation Level
IRHNJ57130
100K Rads (Si)
IRHNJ53130
300K Rads (Si)
IRHNJ54130
600K Rads (Si)
IRHNJ58130
R
DS(on)
0.06鈩?/div>
0.06鈩?/div>
0.06鈩?/div>
I
D
22A*
22A*
22A*
22A*
QPL Part Number
JANSR2N7481U3
JANSF2N7481U3
JANSG2N7481U3
JANSH2N7481U3
IRHNJ57130
JANSR2N7481U3
100V, N-CHANNEL
REF: MIL-PRF-19500/703
TECHNOLOGY
4
#

c
1000K Rads (Si) 0.075鈩?/div>
SMD-0.5
International Rectifier鈥檚 R5
TM
technology provides
high performance power MOSFETs for space appli-
cations. These devices have been characterized for
Single Event Effects (SEE) with useful performance
up to an LET of 80 (MeV/(mg/cm
2
)). The combination
of low R
DS(on)
and low gate charge reduces the power
losses in switching applications such as DC to DC
converters and motor control. These devices retain
all of the well established advantages of MOSFETs
such as voltage control, fast switching, ease of paral-
leling and temperature stability of electrical param-
eters.
Features:
n
n
n
n
n
n
n
n
n
Single Event Effect (SEE) Hardened
Ultra Low R
DS(on)
Low Total Gate Charge
Simple Drive Requirements
Ease of Paralleling
Hermetically Sealed
Surface Mount
Ceramic Package
Light Weight
Absolute Maximum Ratings
Parameter
ID @ VGS = 12V, TC = 25擄C
ID @ VGS = 12V, TC = 100擄C
IDM
PD @ TC = 25擄C
VGS
EAS
IAR
EAR
dv/dt
TJ
T STG
Continuous Drain Current
Continuous Drain Current
Pulsed Drain Current
鉃€
Max. Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy
鉃?/div>
Avalanche Current
鉃€
Repetitive Avalanche Energy
鉃€
Peak Diode Recovery dv/dt
鉃?/div>
Operating Junction
Storage Temperature Range
Pckg. Mounting Surface Temp.
Weight
* Current is limited by package
For footnotes refer to the last page
22*
16
88
75
0.6
鹵20
70
22
7.5
1.4
-55 to 150
300 ( for 5s )
1.0 ( Typical )
Pre-Irradiation
Units
A
W
W/擄C
V
mJ
A
mJ
V/ns
o
C
g
www.irf.com
1
10/24/03

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