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ITU G.772 non-intrusive monitoring for in-service testing for
any one of channel1 to channel7
Low impedance transmit drivers with tri-state
Selectable hardware and parallel/serial host interface
Local, remote and inband loopback test functions
Hitless Protection Switching (HPS) for 1 to 1 protection with-
out relays
JTAG boundary scan for board test
3.3V supply with 5V tolerant I/O
Low power consumption
Operating Temperature Range: -40擄C to +85擄C
Available in 144-pin Thin Quad Flat Pack (TQFP_144_DA) and
160-pin Plastic Ball Grid Array (PBGA) packages
FUNCTIONAL BLOCK DIAGRAM
LOS
Detector
RTIPn
RRINGn
Analog
Loopback
TTIPn
TRINGn
Peak
Detector
Line
Driver
Slicer
CLK&Data
Recovery
(DPLL)
Digital
Loopback
Waveform
Shaper
Transmit
All Ones
G.772
Monitor
Clock
Generator
One of Eight Identical Channels
LOSn
Jitter
Attenuator
B8ZS/
HDB3/AMI
Decoder
Remote
Loopback
Jitter
Attenuator
B8ZS/
HDB3/AMI
Encoder
IBLC
Generator
IBLC
Detector
AIS
Detector
TCLKn
TDn/TDPn
BPVIn/TDNn
RCLKn
RDn/RDPn
CVn/RDNn
Control Interface
Register
File
JTAG TAP
VDD IO
VDDT
VDDD
VDDA
OE
CLKE
MODE[2:0]
CS/JAS
TS2/SCLK/ALE/AS
TS1/RD/R/W
TS0/SDI/WR/DS
SD0/RDY/ACK
INT
LP/D/AD[7:0]
MC/A[4:0]
MCLK
Figure - 1. Block Diagram
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
TRST
TCK
TMS
TDI
TDO
INDUSTRIAL TEMPERATURE RANGES
1
漏
2003 Integrated Device Technology, Inc.
DECEMBER 2003
DSC-6037/11