HY62SF16806B Series
512Kx16bit full CMOS SRAM
Document Title
512K x16 bit 1.8V Super Low Power Full CMOS slow SRAM
Revision History
Revision No
00
01
History
Initial Release
Draft Date
May.29.2001
Remark
Preliminary
Final
DC Electrical Characteristics
Oct.22.2002
- ICC changed 4mA -> 3mA
- ICC1 changed 25mA at 70ns -> 15mA at 70ns
- ICC1 changed 3mA at 1us -> 2mA at 1us
- ISB (TTL) changed 50uA -> 300uA
AC Test Loads
- (R1//R2) 4091Ohm // 3273Ohm -> 3070Ohm // 3150Ohm
AC Test Conditions
- Output Load changed 5pF -> 30pF
- Input Pulse Level 0.4V to 1.6V -> 0.2V to Vcc-0.2
Data Retention Electric Characteristic
- ICCDR LL-Part changed 20uA -> 10uA
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev.01 /Oct. 2002
Hynix
Semiconductor