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HUFA75433S3S Datasheet

  • HUFA75433S3S

  • N-Channel UltraFET MOSFETs 60V, 64A, 16mз

  • 11頁(yè)

  • FAIRCHILD

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HUFA75433S3S
March 2002
HUFA75433S3S
N-Channel UltraFET
廬
MOSFETs
60V, 64A, 16m鈩?/div>
General Description
These N-Channel power MOSFETs are manufactured us-
ing the innovative UltraFET
廬
process. This advanced pro-
cess technology achieves very low on-resistance per
silicon area, resulting in outstanding performance. This de-
vice is capable of withstanding high energy in the ava-
lanche mode and the diode exhibits very low reverse
recovery time and stored charge. It was designed for use in
applications where power efficiency is important, such as
switching regulators, switching convertors, motor drivers,
relay drivers, low-voltage bus switches, and power man-
agement in portable and battery-operated products.
Applications
鈥?Motor and Load Control
鈥?Powertrain Management
Features
鈥?175擄C Maximum Junction Temperature
鈥?UIS Capability (Single Pulse and Repetitive Pulse)
鈥?Ultra-Low On-Resistance r
DS(ON)
= 0.016鈩? V
GS
=
10V
D
D
G
S
TO-263AB
FDB Series
G
S
MOSFET Maximum Ratings
T
C
= 25擄C unless otherwise noted
Symbol
V
DSS
V
GS
Drain to Source Voltage
Gate to Source Voltage
Drain Current
I
D
Continuous (T
C
= 25
o
C, V
GS
= 10V)
Continuous (T
C
=
Pulsed
E
AS
P
D
T
J
, T
STG
Single Pulse Avalanche Energy (Note 1)
Power dissipation
Derate above
25
o
C
Operating and Storage Temperature
125
o
C,
V
GS
= 10V, R
胃JA
=
43
o
C/W)
64
5
Figure 4
250
150
1
-55 to 175
A
A
A
mJ
W
W/
o
C
o
C
Parameter
Ratings
60
鹵20
Units
V
V
Thermal Characteristics
R
胃JC
R
胃JA
R
胃JA
Thermal Resistance Junction to Case TO-263
Thermal Resistance Junction to Ambient TO-263
Thermal Resistance Junction to Ambient TO-263, 1in
2
copper pad area
1
62
43
o
o
C/W
C/W
o
C/W
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
certification.
漏2002 Fairchild Semiconductor Corporation
Rev. A

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