鈩?/div>
鈥?Total Dose
- Meets Pre-RAD Speci鏗乧ations to 100K RAD (Si)
鈥?Single Event
- SEE Immunity for 1E5 ions/cm
2
having an LET of
36MeV/mg/cm
2
and a Range of 36
碌
m with V
DS
up to
80% of Rated Breakdown and V
GS
of 10V Off-Bias
鈥?Dose Rate
- Typically Survives 3E9 RAD (Si)/s at 80% BV
DSS
- Typically Survives 2E12 if Current Limited to I
DM
鈥?Photo Current
- 7.0nA Per-RAD(Si)/s Typically
鈥?Neutron
- Maintain Pre-RAD Speci鏗乧ations
for 3E13 Neutrons/cm
2
- Usable to 3E14 Neutrons/cm
2
NOTE: Current rating de鏗乶ed for TO-254AA package.
Die Characteristics
ATTACH AREAS:
(S) Source - 0.060鈥?Diameter
(G) Gate - 0.032鈥?x 0.032鈥?/div>
(D) Drain - Back Side
DIE THICKNESS:
14 mil
鹵
1 mil
CONTACT METALLIZATION:
Gate and Source - Aluminum (4
碌
)
Drain - Quad-Metal (Al-Ti-Ni-Au)
[Al (3
碌
) - Ti (0.3
碌
) - Ni (1
碌
) - Au (0.05
碌
)]
?
Metallization Mask Layout
FSC150
259 MILS
Symbol
D
G
S
Ordering Information
RAD LEVEL
100K
SCREENING LEVEL
JANKC
PART NUMBER/BRAND
FSC150
next