November 1998
FDG6320C
Dual N & P Channel Digital FET
General Description
These dual N & P-Channel logic level enhancement mode
field effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This very
high density process is especially tailored to minimize
on-state resistance. This device has been designed
especially for low voltage applications as a replacement for
bipolar digital transistors and small signal MOSFETS. Since
bias resistors are not required, this dual digital FET can
replace several different digital transistors, with different bias
resistor values.
Features
N-Ch 0.22 A, 25 V, R
DS(ON)
= 4.0
鈩?/div>
@ V
GS
= 4.5 V,
R
DS(ON)
= 5.0
鈩?/div>
@ V
GS
= 2.7 V.
P-Ch -0.14 A, -25V, R
DS(ON)
= 10
鈩?/div>
@ V
GS
= -4.5V,
R
DS(ON)
= 13
鈩?/div>
@ V
GS
= -2.7V.
Very small package outline SC70-6.
Very low level gate drive requirements allowing direct
operation in 3 V circuits (V
GS(th)
< 1.5 V).
Gate-Source Zener for ESD ruggedness
(>6kV Human Body Model).
SC70-6
SOT-23
SuperSOT -6
TM
SOT-8
SO-8
SOIC-14
S2
G2
D1
1
6
.20
G1
D2
2
5
SC70-6
pin
1
S1
3
4
Absolute Maximum Ratings
Symbol
V
DS
S
V
GSS
I
D
Parameter
Drain-Source Voltage
Gate-Source Voltage
Drain Current
T
A
= 25
o
C unless other wise noted
N-Channel
25
8
0.22
0.65
(Note 1)
P-Channel
-25
-8
-0.14
-0.4
0.3
-55 to 150
6
Units
V
V
A
- Continuous
- Pulsed
P
D
T
J
,T
STG
ESD
Maximum Power Dissipation
W
擄C
kV
Operating and Storage Temperature Ranger
Electrostatic Discharge Rating MIL-STD-883D
Human Body Model (100pf / 1500 Ohm)
THERMAL CHARACTERISTICS
R
胃JA
Thermal Resistance, Junction-to-Ambient
(Note 1)
415
擄C/W
漏 1998 Fairchild Semiconductor Corporation
FDG6320C Rev. D
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