The Edge728 is a quad delay and deskew element.
Memory Test Equipment.
鈮?/div>
8.0 ns with
independent
鹵
750 ps adjustment of the falling edge.
The Edge728 has a drive mode, where one input signal
is routed to all of the outputs. This mode is particularly
useful in a fanout application.
The delay value (and resolution) is controlled via an external
voltage DAC.
This deskew element is designed specifically to be
monotonic and stable while delaying a very narrow pulse
over a wide delay range.
The Edge728 is a pin and functionally compatible upgrade
to the Edge628 with the following differences:
鈥?greater net usable delay range
鈥?greater net usable falling edge
adjustment range
鈥?only one external bias resistor required
鈥?only one external compensation capacitor required
IN1
IN1*
Features
鈥?Pin and Functionally Compatible with the Edge 628
and Edge624 in Modes 0 and 2
鈥?Independent Delay Adjustments for Positive and
Negative Transitions
鈥?Fanout Mode for One Input Distributed to All
Channels
鈥?44-pin MQFP Package with Internal Heat Spreader,
44-pin PLCC with Internal Heat Spreader, or
Die Form
Functional Block Diagram
DRVMODE
S1
OUT1
OUT1*
VDELAY1
VWIDTH1
IN2
IN2*
OUT2
OUT2*
VDELAY2
Applications
鈥?/div>
鈥?/div>
Automatic Test Equipment
Memory Tester Drive On Channel Deske
w
IN3
IN3*
VWIDTH2
OUT3
OUT3*
VDELAY3
VWIDTH3
IN4
IN4*
OUT4
OUT4*
VDELAY4
VWIDTH4
Revision 3 / February 18, 2002
1
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