Common Cathode
Fast Recovery
Epitaxial Diode (FRED)
DSEK 60
I
FAVM
= 2x 26 A
V
RRM
= 1200 V
t
rr
= 40 ns
V
RSM
V
1200
V
RRM
V
1200
Type
TO-247 AD
A
C
A
DSEK 60-12A
A
C
A
C (TAB)
A = Anode, C = Cathode, TAB = Cathode
Symbol
I
FRMS
I
FAVM
每每
x
I
FRM
I
FSM
Test Conditions
T
VJ
= T
VJM
T
C
= 85擄C; rectangular, d = 0.5
t
P
< 10
ms;
rep. rating, pulse width limited by T
VJM
T
VJ
= 45擄C;
t = 10 ms (50 Hz), sine
t = 8.3 ms (60 Hz), sine
Maximum Ratings
50
26
375
200
210
185
195
200
180
170
160
-40...+150
150
-40...+150
A
A
A
A
A
A
A
As
A
2
s
A
2
s
A
2
s
擄C
擄C
擄C
W
Nm
g
2
Features
q
q
q
q
q
T
VJ
= 150擄C; t = 10 ms (50 Hz), sine
t = 8.3 ms (60 Hz), sine
It
2
q
q
International standard package
JEDEC TO-247 AD
Planar passivated chips
Very short recovery time
Extremely low switching losses
Low I
RM
-values
Soft recovery behavior
Epoxy meets UL 94V-0
T
VJ
= 45擄C
t = 10 ms (50 Hz), sine
t = 8.3 ms (60 Hz), sine
T
VJ
= 150擄C; t = 10 ms (50 Hz), sine
t = 8.3 ms (60 Hz), sine
T
VJ
T
VJM
T
stg
P
tot
M
d
Weight
T
C
= 25擄C
Mounting torque
Applications
q
q
q
Rectifiers in switch mode power
supplies (SMPS)
Uninterruptible power supplies (UPS)
Ultrasonic cleaners and welders
125
0.8...1.2
6
Advantages
q
q
Symbol
Test Conditions
Characteristic Values
typ.
max.
750
250
7
2.2
2.55
1.65
18.2
0.9
0.25
70
mA
mA
mA
V
V
V
mW
K/W
K/W
K/W
ns
A
q
I
R
T
VJ
= 25擄C
T
VJ
= 25擄C
T
VJ
= 125擄C
I
F
= 30 A;
V
R
= V
RRM
V
R
= 0.8 鈥?V
RRM
V
R
= 0.8 鈥?V
RRM
T
VJ
= 150擄C
T
VJ
= 25擄C
q
q
High reliability circuit operation
Low voltage peaks for reduced
protection circuits
Low noise switching
Low losses
Operating at lower temperature or
space saving by reduced cooling
V
F
V
T0
r
T
R
thJC
R
thCK
R
thJA
t
rr
I
RM
For power-loss calculations only
T
VJ
= T
VJM
I
F
= 1 A; -di/dt = 100 A/ms; V
R
= 30 V; T
VJ
= 25擄C
V
R
= 540 V; I
F
= 30 A; -di
F
/dt = 240 A/ms
L
攏
0.05
mH;
T
VJ
= 100擄C
40
16
60
18
漏 2000 IXYS All rights reserved
1-2
036
x
I
FAVM
rating includes reverse blocking losses at T
VJM
, V
R
= 0.8 V
RRM
, duty cycle d = 0.5
Data according to IEC 60747 and refer to a single diode unless otherwise stated.
IXYS reserves the right to change limits, test conditions and dimensions
IXYS
1
2
