DSEC 60-06A
DSEC 60-06B
HiPerFRED
TM
Epitaxial Diode
with common cathode and soft recovery
I
FAV
= 2x 30 A
V
RRM
= 600 V
t
rr
= 30/35 ns
TO-247 AD
V
RSM
V
600
600
V
RRM
V
600
600
Type
DSEC 60-06A
DSEC 60-06B
A
C
A
A
C
A
C (TAB)
A = Anode, C = Cathode, TAB = Cathode
Symbol
I
FRMS
I
FAVM
Conditions
rect., d = 0.5; T
C
(Vers. A) = 135擄C
T
C
(Vers. B) = 125擄C
T
VJ
= 45擄C; t
p
= 10 ms (50 Hz), sine
T
VJ
= 25擄C; non-repetitive
I
AS
= 1.3 A; L = 180 碌H
V
A
= 1.5路V
R
typ.; f = 10 kHz; repetitive
Both Versions
Maximum Ratings
70
30
A
A
Features
250
0.2
0.1
-55...+175
175
-55...+150
A
mJ
A
擄C
擄C
擄C
W
Nm
g
q
q
q
q
q
I
FSM
E
AS
I
AR
T
VJ
T
VJM
T
stg
P
tot
M
d
Weight
q
q
q
International standard package
Planar passivated chips
Very short recovery time
Extremely low switching losses
Low I
RM
-values
Soft recovery behaviour
Epoxy meets UL 94V-0
T
C
= 25擄C
mounting torque
typical
165
0.8...1.2
6
Applications
Antiparallel diode for high frequency
switching devices
Antisaturation diode
Snubber diode
Free wheeling diode in converters
and motor control circuits
Rectifiers in switch mode power
supplies (SMPS)
Inductive heating
Uninterruptible power supplies (UPS)
Ultrasonic cleaners and welders
q
q
Symbol
I
R
x
Conditions
T
VJ
= 25擄C V
R
= V
RRM
T
VJ
= 150擄C V
R
= V
RRM
I
F
= 30 A;
T
VJ
= 150擄C
T
VJ
= 25擄C
Characteristic max. Values
Vers. A Vers. B
250
1
1.25
1.60
0.9
0.25
250
2
1.56
2.51
0.9
0.25
typ. 30
typ. 4
mA
mA
V
V
K/W
K/W
ns
A
q
q
V
F
y
R
thJC
R
thCH
t
rr
I
RM
q
q
q
I
F
= 1 A; -di/dt = 200 A/ms;
V
R
= 30 V; T
VJ
= 25擄C
V
R
= 100 V; I
F
= 50 A; -di
F
/dt = 100 A/ms
T
VJ
= 100擄C
typ. 35
typ. 6
Advantages
q
q
q
Avalanche voltage rated for reliable
operation
Soft reverse recovery for low
EMI/RFI
Low I
RM
reduces:
- Power dissipation within the diode
- Turn-on loss in the commutating
switch
Pulse test:
x
Pulse Width = 5 ms, Duty Cycle < 2.0 %
y
Pulse Width = 300
ms,
Duty Cycle < 2.0 %
Data according to IEC 60747 and per diode unless otherwise specified
Dimensions see outlines.pdf
漏 2000 IXYS All rights reserved
1-3
008
IXYS reserves the right to change limits, test conditions and dimensions.