This dual 2-input NAND gate with Schmitt-trigger inputs is designed for 1.65-V to 5.5-V V
operation.
鈰?/div>
B or Y = A + B in positive
logic. The device functions as two independent inverters, but because of Schmitt action, it has different input
threshold levels for positive-going (V
T+
) and negative-going (V
T-
) signals.
NanoStar鈩?and NanoFree鈩?package technology is a major breakthrough in IC packaging concepts, using the
die as the package.
This device can be triggered from the slowest of input ramps and still give clean jitter-free output signals.
ORDERING INFORMATION
T
A
PACKAGE
(1)
NanoStar鈩?鈥?WCSP (DSBGA)
0.23-mm Large Bump 鈥?YEP
NanoFree鈩?鈥?WCSP (DSBGA)
0.23-mm Large Bump 鈥?YZP
(Pb-free)
SSOP 鈥?DCT
VSSOP 鈥?DCU
(1)
(2)
Reel of 3000
SN74LVC2G132YZPR
Reel of 3000
Reel of 3000
Reel of 250
SN74LVC2G132DCTR
SN74LVC2G132DCUR
SN74LVC2G132DCUT
C3B_ _ _
C3B_
ORDERABLE PART NUMBER
SN74LVC2G132YEPR
_ _ _D5_
TOP-SIDE MARKING
(2)
鈥?0擄C to 85擄C
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
DCT: The actual top-side marking has three additional characters that designate the year, month, and assembly/test site.
DCU: The actual top-side marking has one additional character that designates the assembly/test site.
YEP/YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following
character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition (1 = SnPb,
鈰?/div>
= Pb-free).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar, NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright 漏 2004鈥?005, Texas Instruments Incorporated
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