鈥?/div>
Can Be Used in Three Combinations:
鈥?OR-AND Gate
鈥?OR Gate
鈥?AND Gate
I
off
Supports Partial-Power-Down Mode
Operation
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
ESD Protection Exceeds JESD 22
鈥?2000-V Human-Body Model (A114-A)
鈥?200-V Machine Model (A115-A)
鈥?1000-V Charged-Device Model (C101)
YEP OR YZP PACKAGE
(BOTTOM VIEW)
DCK PACKAGE
(TOP VIEW)
A
GND
B
1
6
C
V
CC
Y
A
GND
1
2
3
6
5
4
C
V
CC
Y
B
GND
A
3
2
1
4
5
6
Y
V
CC
C
2
5
B
3
4
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This device is designed for 1.65-V to 5.5-V V
CC
operation.
The SN74LVC1G3208 is a single 3-input positive OR-AND gate. It performs the Boolean function Y = (A + B)
鈰?/div>
C
in positive logic.
ORDERING INFORMATION
T
A
PACKAGE
(1)
NanoStar鈩?鈥?WCSP (DSBGA)
0.23-mm Large Bump 鈥?YEP
NanoFree鈩?鈥?WCSP (DSBGA)
0.23-mm Large Bump 鈥?YZP
(Pb-free)
SOT (SOT-23) 鈥?DBV
SOT (SC-70) 鈥?DCK
Reel of 3000
SN74LVC1G3208YZPR
Reel of 3000
Reel of 250
Reel of 3000
Reel of 250
SN74LVC1G3208DBVR
SN74LVC1G3208DBVT
SN74LVC1G3208DCKR
SN74LVC1G3208DCKT
ORDERABLE PART NUMBER
SN74LVC1G3208YEPR
_ _ _ DD _
TOP-SIDE MARKING
(2)
鈥?0擄C to 85擄C
CDD_
DD_
(1)
(2)
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
DBV/DCK: The actual top-side marking has one additional character that designates the assembly/test site.
YEP/YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following
character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition (1 = SnPb,
鈰?/div>
= Pb-free).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar, NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright 漏 2004鈥?005, Texas Instruments Incorporated
next