REVISIONS
LTR
A
DESCRIPTION
Make changes to TR(tr), TR(os), SR+, SR-, NI(BB), NI(PC), CS tests as
specified in table I , 1.5, 4.4.1b, and table II. - ro
DATE (YR-MO-DA)
99-10-20
APPROVED
R. MONNIN
B
Add test conditions to the input offset voltage temperature sensitivity test and
the input offset current temperature sensitivity test in table I. Make changes to
the title in table IIB. Editorial changes throughout. - rrp
99-11-17
R. MONNIN
C
Add radiation hardened level 鈥淟鈥?devices and delete figures 1 and 3. - ro
02-06-13
R. MONNIN
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
C
15
C
16
REV
SHEET
PREPARED BY
RAJESH PITHADIA
C
1
C
2
C
3
C
4
C
5
C
6
C
7
C
8
C
9
C
10
C
11
C
12
C
13
C
14
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
RAJESH PITHADIA
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
http://www.dscc.dla.mil
APPROVED BY
RAYMOND MONNIN
MICROCIRCUIT, LINEAR, RADIATION
HARDENED, QUAD OPERATIONAL AMPLIFIER,
MONOLITHIC SILICON
DRAWING APPROVAL DATE
98-11-06
AMSC N/A
REVISION LEVEL
C
SIZE
A
SHEET
CAGE CODE
67268
1 OF
16
5962-99504
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
5962-E448-02