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5962-9318601MLA Datasheet

  • 5962-9318601MLA

  • SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

  • 25頁(yè)

  • TI

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SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS124D 鈥?AUGUST 1992 鈥?REVISED DECEMBER 1996
D
D
D
D
D
D
description
The 鈥橝BT8245 scan test devices with octal bus
transceivers are members of the Texas Instru-
ments SCOPE
鈩?/div>
testability integrated-circuit
family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
A2
A1
OE
NC
DIR
B1
B2
5
6
7
8
9
A3
A4
A5
NC
V
CC
A6
A7
4
3 2 1 28 27 26
25
24
23
22
21
20
10
11
19
12 13 14 15 16 17 18
D
Members of the Texas Instruments
SCOPE
鈩?/div>
Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
Functionally Equivalent to 鈥橣245 and
鈥橝BT245 in the Normal-Function Mode
SCOPE
鈩?/div>
Instruction Set:
鈥?IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
鈥?Parallel-Signature Analysis at Inputs
With Masking Option
鈥?Pseudo-Random Pattern Generation
From Outputs
鈥?Sample Inputs/Toggle Outputs
鈥?Binary Count From Outputs
鈥?Even-Parity Opcodes
Two Boundary-Scan Cells per I/O for
Greater Flexibility
State-of-the-Art
EPIC-
螜螜
B
鈩?/div>
BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Plastic
Small-Outline Packages (DW), Ceramic
Chip Carriers(FK), and Standard Ceramic
DIPs (JT)
SN54ABT8245 . . . JT PACKAGE
SN74ABT8245 . . . DW PACKAGE
(TOP VIEW)
DIR
B1
B2
B3
B4
GND
B5
B6
B7
B8
TDO
TMS
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
OE
A1
A2
A3
A4
A5
V
CC
A6
A7
A8
TDI
TCK
SN54ABT8245 . . . FK PACKAGE
(TOP VIEW)
A8
TDI
TCK
NC
TMS
TDO
B8
NC 鈥?No internal connection
In the normal mode, these devices are functionally equivalent to the 鈥橣245 and 鈥橝BT245 octal bus transceivers.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the
functional operation of the SCOPE
鈩?/div>
octal bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The
output-enable (OE) input can be used to disable the device so that the buses are effectively isolated.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-螜螜B are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
鈥?/div>
DALLAS, TEXAS 75265
B3
B4
GND
NC
B5
B6
B7
Copyright
漏
1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
1

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