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5962-9174601QLA Datasheet

  • 5962-9174601QLA

  • SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS

  • 469.26KB

  • 26頁(yè)

  • TI

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SN54BCT8240A, SN74BCT8240A
SCAN TEST DEVICES
WITH OCTAL INVERTING BUFFERS
SCBS067E 鈥?FEBRUARY 1990 鈥?REVISED DECEMBER 1996
D
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Members of the Texas Instruments
SCOPE
鈩?/div>
Family of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to 鈥橣240 and
鈥橞CT240 in the Normal-Function Mode
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Test Operation Synchronous to Test
Access Port (TAP)
Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V ) on TMS Pin
SCOPE
鈩?/div>
Instruction Set
鈥?IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
鈥?Parallel-Signature Analysis at Inputs
鈥?Pseudo-Random Pattern Generation
From Outputs
鈥?Sample Inputs/Toggle Outputs
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
and Ceramic 300-mil DIPs (JT, NT)
SN54BCT8240A . . . JT PACKAGE
SN74BCT8240A . . . DW OR NT PACKAGE
(TOP VIEW)
1OE
1Y1
1Y2
1Y3
1Y4
GND
2Y1
2Y2
2Y3
2Y4
TDO
TMS
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
2OE
1A1
1A2
1A3
1A4
2A1
V
CC
2A2
2A3
2A4
TDI
TCK
SN54BCT8240A . . . FK PACKAGE
(TOP VIEW)
description
The 鈥橞CT8240A scan test devices with octal
buffers are members of the Texas Instruments
SCOPE鈩?testability integrated-circuit family. This
family of devices supports IEEE Standard
1149.1-1990 boundary scan to facilitate testing of
complex circuit-board assemblies. Scan access
to the test circuitry is accomplished via the 4-wire
test access port (TAP) interface.
1A2
1A1
2OE
NC
1OE
1Y1
1Y2
5
6
7
8
9
1A3
1A4
2A1
NC
V
CC
2A2
2A3
4
3 2 1 28 27 26
25
24
23
22
21
20
10
11
19
12 13 14 15 16 17 18
2A4
TDI
TCK
NC
TMS
TDO
2Y4
NC 鈥?No internal connection
In the normal mode, these devices are functionally equivalent to the 鈥橣240 and 鈥橞CT240 octal buffers. The test
circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the
functional operation of the SCOPE鈩?octal buffers.
In the test mode, the normal operation of the SCOPE鈩?octal buffers is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations, as described in IEEE Standard 1149.1-1990.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
鈥?/div>
DALLAS, TEXAS 75265
1Y3
1Y4
GND
NC
2Y1
2Y2
2Y3
Copyright
漏
1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
1

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