鈥?/div>
Application for Ultra-compact ECM
0.2鹵0.05
1.2鹵0.05
0.3鹵0.05
3
0.8鹵0.05
Unit: mm
1.2鹵0.05
0.8鹵0.1
Absolute Maximum Ratings
(Ta=25擄C)
Characteristic
Gate-Drain voltage
Gate Current
Drain power dissipation (Ta
=
25擄C)
Junction Temperature
Storage temperature range
Symbol
V
GDO
I
G
P
D
T
j
T
stg
Rating
-20
10
100
125
鈭?5~125
Unit
V
mA
mW
擄C
擄C
0.4
1
2
0.4
0.28鹵0.02
Note:
Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating
temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba
Semiconductor Reliability Handbook (鈥淗andling
Precautions鈥?鈥淒erating Concept and Methods鈥? and individual
reliability data (i.e. reliability test report and estimated failure rate,
etc).
VESM2
JEDEC
JEITA
TOSHIBA
1.Drain
2.Source
3.Gate
-
-
2-1H1A
Weight: 0.8mg (typ.)
IDSS CLASSIFICATION
A-Rank
140~240碌A(chǔ)
B-Rank
210~350碌A(chǔ)
BK-Rank 210~400碌A(chǔ)
C-Rank
320~500碌A(chǔ)
Marking
Type Name
Top Gate
Lot Code
IDSS Classification Symbol
A :A-Rank
B :B-Rank BK-Rank
C :C-Rank
Equivalent Circuit
D
8
鈻?/div>
G
S
Precaution
There is a metal plate on the top of package, which has the same electrical potential as the Gate terminal. Don鈥檛 use
it as a terminal.
1
2007-11-01
0.09鹵0.03
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