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Built-in Joint Test Action Group (JTAG) boundary-scan test
(BST) circuitry compliant with IEEE Std. 1149.1-1990, available
without consuming additional device logic
f
For information on 5.0-V FLEX
廬
10K or 3.3-V FLEX 10KA devices, see the
FLEX 10K Embedded Programmable Logic Family Data Sheet.
Table 1. FLEX 10KE Device Features
Feature
Typical gates
(1)
Maximum system gates
Logic elements (LEs)
EABs
Total RAM bits
Maximum user I/O pins
Altera Corporation
DS-F10KE-2.5
EPF10K30E
30,000
119,000
1,728
6
24,576
220
EPF10K50E
EPF10K50S
50,000
199,000
2,880
10
40,960
254
1