HCTS393D Datasheet

IC型號(hào)：
HCTS393D
PDF描述：
Radiation Hardened Dual 4-Stage Binary Counter
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Speci鏗乧ations HCTS393MS

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUPS

Initial Test (Preburn-In)

Interim Test

(Postburn-In)

Interim Test

(Postburn-In)

PDA

Interim Test

III

(Postburn-In)

PDA

Final Test

Group A (Note 1)

Group B

Subgroup B-5

Subgroup B-6

Group D

NOTE:

1. Alternate group A inspection in accordance with Method 5005 of MIL-STD-883 may be exercised.

METHOD

100%/5004

Sample/5005

GROUP A SUBGROUPS

1, 7, 9

1, 7, 9, Deltas

1, 7, 9

1, 7, 9, Deltas

2, 3, 8A, 8B, 10, 11

1, 2, 3, 7, 8A, 8B, 9, 10, 11

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

1, 7, 9

Subgroups 1, 2, 3, 9, 10, 11

READ AND RECORD

ICC, IOL/H

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

Group E Subgroup 2

NOTE:

1. Except FN test which will be performed 100% Go/No-Go.

TEST

METHOD

5005

PRE RAD

1, 7, 9

POST RAD

Table 4

READ AND RECORD

PRE RAD

1, 9

POST RAD

Table 4 (Note 1)

TABEL 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS

OSCILLATOR

OPEN

GROUND

1/2 VCC = 3V

鹵

0.5V

VCC = 6V

鹵

0.5V

50kHz

25kHz

STATIC BURN-IN I TEST CONNECTIONS (Note 1)

3 - 6, 8 - 11

1, 2, 7, 12, 13

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

3 - 6, 8 - 11

1, 2, 12 - 14

DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)

NOTES:

1. Each pin except VCC and GND will have a resistor of 10K鈩?/div>

鹵

5% for static burn-in

2. Each pin except VCC and GND will have a resistor of 1K鈩?/div>

鹵

5% for dynamic burn-in

3 - 6, 8 - 11

1, 13

2, 12

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

3 - 6, 8 - 11

GROUND

VCC = 5V

鹵

0.5V

1, 2, 12 - 14

NOTE: Each pin except VCC and GND will have a resistor of 47K鈩?/div>

鹵

5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.

Spec Number

677

518633

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