鈥?/div>
64-Instruction Capacity
External Clock Prescale (ECP) Module
鈥?Programmable Low-Frequency External
Clock (CLK)
12-Channel 10-Bit Multi-Buffered ADC
(MibADC)
鈥?64-Word FIFO Buffer
鈥?Single- or Continuous-Conversion Modes
鈥?1.55 碌s Minimum Sample/Conversion Time
鈥?Calibration Mode and Self-Test Features
Flexible Interrupt Handling
Expansion Bus Module (EBM) (PGE only)
鈥?Supports 8- and 16-Bit Expansion Bus
Memory Interface Mappings
鈥?42 I/O Expansion Bus Pins
50 Dedicated General-Purpose I/O (GIO) Pins
and 43 Additional Peripheral I/Os (PGE)
14 Dedicated General-Purpose I/O (GIO) Pins
and 43 Additional Peripheral I/Os (PZ)
16 External Interrupts
On-Chip Scan-Base Emulation Logic, IEEE
Standard 1149.1
(1)
(JTAG) Test-Access Port
144-Pin Plastic Low-Profile Quad Flatpack
(PGE Suffix)
100-Pin Plastic Low-Profile Quad Flatpack (PZ
Suffix)
The test-access port is compatible with the IEEE Standard
1149.1-1990, IEEE Standard Test-Access Port and Boundary
Scan Architecture specification. Boundary scan is not
supported on this device.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
ARM7TDMI is a trademark of Advanced RISC Machines Limited (ARM).
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright 漏 2005, Texas Instruments Incorporated