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Second-Generation PLD Architecture
High-Performance Operation:
f
max
(External Feedback) . . . 80 MHz
Propagation Delay . . . 7.5 ns Max
Increased Logic Power 鈥?Up to 22 Inputs
and 10 Outputs
Increased Product Terms 鈥?Average of 12
Per Output
Variable Product Term Distribution
Allows More Complex Functions to Be
Implemented
Each Output Is User Programmable for
Registered or Combinational Operation,
Polarity, and Output Enable Control
Power-Up Clear on Registered Outputs
TTL-Level Preload for Improved Testability
Extra Terms Provide Logical Synchronous
Set and Asynchronous Reset Capability
Fast Programming, High Programming
Yield, and Unsurpassed Reliability Ensured
Using Ti-W Fuses
AC and DC Testing Done at the Factory
Utilizing Special Designed-In Test Features
Package Options Include Both Plastic Chip
Carrier and Plastic DIP
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description
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No internal connection
Pin assignments in operating mode
The TIBPAL22V10-7C is a programmable array logic device featuring high speed and functional equivalency
when compared to presently available devices. The TIBPAL22V10-7C is implemented with the familiar
sum-of-products (AND-OR) logic structure featuring programmable output logic macrocells. This IMPACT-X鈩?/div>
circuit combines the latest Advanced Low-Power Schottky technology with proven titanium-tungsten fuses to
provide reliable, high-performance substitutes for conventional TTL logic.
This device contains up to 22 inputs and 10 outputs. It incorporates the unique capability of defining and
programming the architecture of each output on an individual basis. Outputs can be registered or nonregistered
and inverting or noninverting as shown in the output logic macrocell diagram. The ten potential outputs are
enabled through the use of individual product terms.
These devices are covered by U.S. Patent 4,410,987.
IMPACT-X is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright
漏
1995, Texas Instruments Incorporated
POST OFFICE BOX 655303
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DALLAS, TEXAS 75265
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