SCAN18374T D-Type Flip-Flop with 3-STATE Outputs
October 1991
Revised May 2000
SCAN18374T
D-Type Flip-Flop with 3-STATE Outputs
General Description
The SCAN18374T is a high speed, low-power D-type flip-
flop featuring separate D-type inputs organized into dual 9-
bit bytes with byte-oriented clock and output enable control
signals. This device is compliant with IEEE 1149.1 Stan-
dard Test Access Port and BOUNDARY-SCAN Architec-
ture with the incorporation of the defined BOUNDARY-
SCAN test logic and test access port consisting of Test
Data Input (TDI), Test Data Out (TDO), Test Mode Select
(TMS), and Test Clock (TCK).
Features
s
IEEE 1149.1 (JTAG) Compliant
s
Buffered positive edge-triggered clock
s
3-STATE outputs for bus-oriented applications
s
9-bit data busses for parity applications
s
Reduced-swing outputs source 32 mA/sink 64 mA
s
Guaranteed to drive 50
鈩?/div>
transmission line to TTL input
levels of 0.8V and 2.0V
s
TTL compatible inputs
s
25 mil pitch SSOP (Shrink Small Outline Package)
s
Includes CLAMP and HIGHZ instructions
s
Member of Fairchild鈥檚 SCAN Products
Ordering Code:
Order Number
SCAN18374TSSC
Package Number
MS56A
Package Description
56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter 鈥淴鈥?to the ordering code.
Connection Diagram
Pin Descriptions
Pin Names
AI
(0鈥?)
, BI
(0鈥?)
ACP, BCP
AOE
1
, BOE
1
AO
(0鈥?)
, BO
(0鈥?)
Data Inputs
Clock Pulse Inputs
3-STATE Output Enable Inputs
3-STATE Outputs
Description
Truth Tables
Inputs
ACP
AOE
1
H
L
L
Inputs
BCP
BOE
1
H
L
L
BI
(0鈥?)
X
L
H
BO
(0鈥?)
Z
L
H
AI
(0鈥?)
X
L
H
AO
(0鈥?)
Z
L
H
X
H
=
HIGH Voltage Level
L
=
LOW Voltage Level
X
=
Immaterial
Z
=
High Impedance
=
L-to-H Transition
X
漏 2000 Fairchild Semiconductor Corporation
DS010963
www.fairchildsemi.com
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