SCAN18374T D Flip-Flop with TRI-STATE Outputs
September 1998
SCAN18374T
D Flip-Flop with TRI-STATE
廬
Outputs
General Description
The SCAN18374T is a high speed, low-power D-type
flip-flop featuring separate D-type inputs organized into dual
9-bit bytes with byte-oriented clock and output enable control
signals. This device is compliant with IEEE 1149.1 Standard
Test Access Port and BOUNDARY-SCAN Architecture with
the incorporation of the defined BOUNDARY-SCAN test
logic and test access port consisting of Test Data Input (TDI),
Test Data Out (TDO), Test Mode Select (TMS), and Test
Clock (TCK).
Features
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IEEE 1149.1 (JTAG) Compliant
Buffered positive edge-triggered clock
TRI-STATE outputs for bus-oriented applications
9-bit data busses for parity applications
Reduced-swing outputs source 24 mA/sink 48 mA (Mil)
Guaranteed to drive 50鈩?transmission line to TTL input
levels of 0.8V and 2.0V
TTL compatible inputs
25 mil pitch Cerpack packaging
Includes CLAMP and HIGHZ instructions
Standard Microcircuit Drawing (SMD) 5962-9320701
Connection Diagram
Pin Names
AOE
1
, BOE
1
AO
(0鈥?)
, BO
(0鈥?)
Description
TRI-STATE Output Enable Inputs
TRI-STATE Outputs
DS100322-1
Pin Names
AI
(0鈥?)
, BI
(0鈥?)
ACP, BCP
Description
Data Inputs
Clock Pulse Inputs
TRI-STATE
廬
is a registered trademark of National Semiconductor Corporation.
漏 1998 National Semiconductor Corporation
DS100322
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