鈭?/div>
Hz
DESCRIPTION
The OPA656 combines a very wideband, unity-gain stable,
voltage-feedback op amp with a FET-input stage to offer an
ultra high dynamic-range amplifier for ADC (Analog-to-Digital
Converter) buffering and transimpedance applications. Extremely
low DC errors give good precision in optical applications.
The high unity-gain stable bandwidth and JFET input allows
exceptional performance in high-speed, low-noise integrators.
The high input impedance and low bias current provided by
the FET input is supported by the ultra-low 7nV/鈭欻z input
voltage noise to achieve a very low integrated noise in
wideband photodiode transimpedance applications.
Broad transimpedance bandwidths are achievable given the
OPA656鈥檚 high 230MHz gain bandwidth product. As shown
below, a 鈥?dB bandwidth of 1MHz is provided even for a high
1M鈩?transimpedance gain from a 47pF source capacitance.
APPLICATIONS
q
WIDEBAND PHOTODIODE AMPLIFIER
q
q
q
q
q
SAMPLE-AND-HOLD BUFFER
CCD OUTPUT BUFFER
ADC INPUT BUFFER
WIDEBAND PRECISION AMPLIFIER
TEST AND MEASUREMENT FRONT END
RELATED OPERATIONAL AMPLIFIER PRODUCTS
SLEW VOLTAGE
V
S
BW RATE NOISE
(V) (MHz) (V/
碌
S) (nV/
鈭?/div>
HZ) AMPLIFIER DESCRIPTION
300
290
700
55
100
5.8
6
4.8
4.5
5.4
Unity-Gain Stable CMOS
Unity-Gain Stable FET-Input
Gain of +7 Stable FET-Input
Unity-Gain Stable FET-Input
Unity-Gain Stable FET-Input
DEVICE
1pF
499k鈩?/div>
499k鈩?/div>
OPA355 +5 200
OPA655
鹵5
400
OPA657
鹵5
1600
OPA627
鹵15
16
THS4601
鹵15
180
1M鈩?TRANSIMPEDANCE BANDWIDTH
130
1MHz Bandwidth
Transimpedance Gain (dB)
位
(47pF)
OPA656
V
O
120
110
鈥揤
b
100
Wideband Photodiode Transimpedance Amplifier
90
80
10kHz
100kHz
Frequency
1MHz
5MHz
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright 漏 2001, Texas Instruments Incorporated
www.ti.com
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