V鈥?/div>
1
2
3
4
8-Pin DIP, SO-8
8
7
6
5
Offset Trim
V+
Output
NC
OPA132
DESCRIPTION
The OPA132 series of FET-input op amps provides high-
speed and excellent dc performance. The combination of
high slew rate and wide bandwidth provide fast settling time.
Single, dual, and quad versions have identical specifications
for maximum design flexibility. High performance grades
are available in the single and dual versions. All are ideal for
general-purpose, audio, data acquisition and communica-
tions applications, especially where high source impedance
is encountered.
OPA132 op amps are easy to use and free from phase
inversion and overload problems often found in
common FET-input op amps. Input cascode circuitry pro-
vides excellent common-mode rejection and
maintains low input bias current over its wide input voltage
range. OPA132 series op amps are stable in unity gain and
provide excellent dynamic behavior over a wide range of
load conditions, including high load capacitance. Dual and
quad versions feature completely independent circuitry for
lowest crosstalk and freedom from interaction, even when
overdriven or overloaded.
Single and dual versions are available in 8-pin DIP and
SO-8 surface-mount packages. Quad is available in 14-pin
DIP and SO-14 surface-mount packages. All are specified
for 鈥?0擄C to +85擄C operation.
Out A
鈥揑n A
+In A
V鈥?/div>
1
2
3
4
8-Pin DIP, SO-8
A
B
8
7
6
5
V+
Out B
鈥揑n B
+In B
OPA4132
Out A
鈥揑n A
+In A
V+
+In B
鈥揑n B
Out B
1
2
A
3
4
5
B
6
7
14-Pin DIP
SO-14
C
9
8
鈥揑n C
Out C
D
12
11
10
+In D
V鈥?/div>
+In C
14
13
Out D
鈥揑n D
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright 漏 1995-2004, Texas Instruments Incorporated
www.ti.com
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