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JL101ASGA Datasheet

  • JL101ASGA

  • OP-AMP|SINGLE|BIPOLAR|CAN|8PIN|METAL

  • 271.58KB

  • 17頁

  • ETC

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MICROCIRCUIT DATA SHEET
MJLM101A-X REV 0A0
Original Creation Date: 06/21/95
Last Update Date: 03/28/00
Last Major Revision Date: 01/19/00
SINGLE OPERATIONAL AMPLIFIER - EXTERNALLY COMPENSATED
General Description
The LM101A is a general purpose operational amplifier which features improved performance
over industry standards such as the LM709. Advanced processing techniques make possible
an order of magnitude reduction in input currents, and a redesign of the biasing circuitry
reduces the temperature drift of input current.
This amplifier offers many features which make its application nearly foolproof: overload
protection on the input and output, no latch-up when the common mode range is exceeded,
and freedom from oscillations and compensation with a single 30 pF capacitor. It has
advantages over internally compensated amplifiers in that the frequency compensation can
be tailored to the particular application. For example, in low frequency circuits it can
be overcompensated for increased stability margin. Or the compensation can be optimized
to give more than a factor of ten improvement in high frequency performance for most
applications.
In addition, the device provides better accuracy and lower noise in high impedance
circuitry. The low input currents also make it particularly well suited for long interval
integrators or timers, sample and hold circuits and low frequency waveform generators.
Further, replacing circuits where matched transistor pairs buffer the inputs of
conventional IC op amps, it can give lower offset voltage and a drift at a lower cost.
Industry Part Number
LM101A
NS Part Numbers
JL101ABCA
JL101ABGA
JL101ABHA
JL101ABPA
JL101ASCA
JL101ASGA
JL101ASHA
JL101ASPA
Prime Die
LM101A
Controlling Document
38510/10103,AMEND.2 CIR.G
REV G
Processing
MIL-STD-883, Method 5004
Subgrp Description
1
2
3
4
5
6
7
8A
8B
9
10
11
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temp (
o
C)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
Quality Conformance Inspection
MIL-STD-883, Method 5005
1

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