300K Rads (Si) 1.1鈩?/div>
I
D
CHANNEL
1.0A
N
1.0A
N
-0.75A
P
-0.75A
P
MO-036AB
International Rectifier鈥檚 RAD-Hard
TM
HEXFET
廬
MOSFET
Technology provides high performance power MOSFETs
for space applications. This technology has over a decade
of proven performance and reliability in satellite applica-
tions. These devices have been characterized for both
Total Dose and Single Event Effects (SEE). The combina-
tion of low R
DS(on)
and low gate charge reduces the power
losses in switching applications such as DC to DC con-
verters and motor control. These devices retain all of the
well established advantages of MOSFETs such as voltage
control, fast switching, ease of paralleling and tempera-
ture stability of electrical parameters.
Features:
n
n
n
n
n
n
n
n
n
Single Event Effect (SEE) Hardened
Low R
DS(on)
Low Total Gate Charge
Proton Tolerant
Simple Drive Requirements
Ease of Paralleling
Hermetically Sealed
Ceramic Package
Light Weight
Absolute Maximum Ratings (Per Die)
Parameter
ID @ VGS =鹵 12V, TC = 25擄C Continuous Drain Current
ID @ VGS =鹵 12V, TC = 100擄C Continuous Drain Current
IDM
PD @ TC = 25擄C
VGS
EAS
IAR
EAR
dv/dt
TJ
T STG
Pulsed Drain Current
鉃€
Max. Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy
Avalanche Current
鉃€
Repetitive Avalanche Energy
鉃€
Peak Diode Recovery dv/dt
Operating Junction
Storage Temperature Range
Lead Temperature
Weight
For footnotes refer to the last page
Pre-Irradiation
N-Channel
1.0
0.6
4.0
1.4
0.011
鹵20
56
鉃?/div>
1.0
0.14
2.4
鉃?/div>
-55 to 150
o
P-Channel
-0.75
-0.5
-3.0
1.4
0.011
Units
A
W
W/擄C
鹵20
75
~
-0.75
0.14
2.4
V
mJ
A
mJ
V/ns
C
300 (0.63 in./1.6 mm from case for 10s)
1.3 (Typical)
g
www.irf.com
1
07/17/01
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