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IDT54FCT162511CTPV Datasheet

  • IDT54FCT162511CTPV

  • FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER WITH PARITY

  • 11頁

  • IDT

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Integrated Device Technology, Inc.
FAST CMOS 16-BIT
REGISTERED/LATCHED
TRANSCEIVER WITH PARITY
IDT54/74FCT162511AT/CT
FEATURES:
鈥?/div>
鈥?/div>
鈥?/div>
鈥?/div>
鈥?/div>
鈥?/div>
鈥?/div>
鈥?/div>
鈥?/div>
鈥?/div>
鈥?/div>
0.5 MICRON CMOS Technology
Typical tsk(o) (Output Skew) < 250ps, clocked mode
Low input and output leakage
鈮?碌A(chǔ)
(max)
ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
Packages include 25 mil pitch SSOP, 19.6 mil pitch TSSOP,
15.7 mil pitch TVSOP and 25 mil pitch Cerpack
Extended commercial range of 鈥?0擄C to +85擄C
V
CC
= 5V
鹵10%
Balanced Output Drivers:
鹵24mA
(commercial)
鹵16mA
(military)
Series current limiting resistors
Generate/Check, Check/Check modes
Open drain parity error allows wire-OR
DESCRIPTION:
The FCT162511AT/CT 16-bit registered/latched transceiver
with parity is built using advanced dual metal CMOS technol-
ogy. This high-speed, low-power transceiver combines D-
type latches and D-type flip-flops to allow data flow in transpar-
ent, latched or clocked modes. The device has a parity
generator/cheker in the A-to-B direction and a parity checker
in the B-to-A direction. Error checking is done at the byte level
with separate parity bits for each byte. Separate error flags
exits for each direction with a single error flag indicating an
error for either byte in the A-to-B direction and a second error
flag indicating an error for either byte in the B-to-A direction.
The parity error flags are open drain outputs which can be tied
together and/or tied with flags from other devices to form a
single error flag or interrupt. The parity error flags are enabled
by the
OExx
control pins allowing the designer to disable the
error flag during combinational transitions.
The control pins LEAB, CLKAB and
OEAB
control opera-
tion in the A-to-B direction while LEBA, CLKBA and
OEBA
control the B-to-A direction.
GEN
/CHK is only for the selection
of A-to-B operation, the B-to-A direction is always in checking
mode. The ODD/
EVEN
select is common between the two
directions. Except for the ODD/
EVEN
control, independent
operation can be achieved between the two directions by
using the corresponding control lines.
SIMPLIFIED FUNCTIONAL BLOCK DIAGRAM:
LEAB
CLKAB
Data
16
Parity
GEN/CHK
Byte
Parity
Generator/
Checker
2
Latch/
Register
Parity, data
18
OEAB
B0-15
PB1,2
PERB
(Open Drain)
A0-15
PA1,2
ODD/EVEN
LEBA
CLKBA
Parity, data
18
OEBA
PERA
(Open Drain)
Latch/
Register
Byte
Parity
Checking
Parity, Data
18
2916 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
漏1996
Integrated Device Technology, Inc.
AUGUST 1996
DSC鈥?916/5
5.11
1

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