IN 鈥?/div>
IN +
V
CC +
D5
B1
B2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
UNDER RANGE
OVER RANGE
STROBE
RUN/HOLD
DGTL GND
POLARITY
CLK
BUSY
D1
D2
D3
D4
B8
B4
description
The ICL7135C and TLC7135C converters are manufactured with Texas Instruments highly efficient CMOS
technology. These 4 1/2-digit, dual-slope-integrating, analog-to-digital converters (DACs) are designed to
provide interfaces to both a microprocessor and a visual display. The digit-drive outputs D1 through D4 and
multiplexed binary-coded-decimal outputs B1, B2, B4, and B8 provide an interface for LED or LCD
decoder/drivers as well as microprocessors.
The ICL7135C and TLC7135C offer 50-ppm (one part in 20,000) resolution with a maximum linearity error of
one count. The zero error is less than 10
碌V
and zero drift is less than 0.5
碌V/擄C.
Source-impedance errors are
minimized by low input current (less than 10 pA). Rollover error is limited to
鹵
1 count.
The BUSY, STROBE, RUN/HOLD, OVER RANGE, and UNDER RANGE control signals support
microprocessor-based measurement systems. The control signals also can support remote data acquisition
systems with data transfer through universal asynchronous receiver transmitters (UARTs).
The ICL7135C and TLC7135C are characterized for operation from 0擄C to 70擄C.
AVAILABLE OPTIONS
PACKAGE
TA
PLASTIC DIP
(N)
ICL7135CN
TLC7135CN
TLC7135CDW
SMALL OUTLINE
(DW)
0擄C to 70擄C
Caution. These devices have limited built-in protection. The leads should be shorted together or the device placed in conductive foam
during storage or handlilng to prevent electrostatic damage to the MOS gates.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright
漏
1999, Texas Instruments Incorporated
POST OFFICE BOX 655303
鈥?/div>
DALLAS, TEXAS 75265
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