鈩?/div>
鈥?UIS Rated
鈥?Total Dose
- Meets Pre-RAD Speci鏗乧ations to 100K RAD (Si)
鈥?Single Event
- Safe Operating Area Curve for Single Event Effects
- SEE Immunity for LET of 82MeV/mg/cm
2
with
V
DS
up to 80% of Rated Breakdown
鈥?Dose Rate
- Typically Survives 3E9 RAD (Si)/s at 80% BV
DSS
- Typically Survives 2E12 if Current Limited to I
AS
鈥?Photo Current
- 1.2nA Per-RAD (Si)/s Typically
鈥?Neutron
- Maintain Pre-RAD Speci鏗乧ations
for 3E13 Neutrons/cm
2
- Usable to 3E14 Neutrons/cm
2
The Fairchild family of Star*Power FETs includes a series of
devices in various voltage, current and package styles. The
portfolio consists of Star*Power and Star*Power Gold
products. Star*Power FETs are optimized for total dose and
r
DS(ON)
while exhibiting SEE capability at full rated voltage
up to an LET of 37. Star*Power Gold FETs have been
optimized for SEE and Gate Charge combining SEE
performance to 80% of the rated voltage for an LET of 82
with extremely low gate charge characteristics.
This MOSFET is an enhancement-mode silicon-gate power
鏗乪ld effect transistor of the vertical DMOS (VDMOS)
structure. It is speci鏗乧ally designed and processed to be
radiation tolerant. The MOSFET is well suited for
applications exposed to radiation environments such as
switching regulation, switching converters, power
distribution, motor drives and relay drivers as well as other
power control and conditioning applications. As with
conventional MOSFETs these Radiation Hardened
MOSFETs offer ease of voltage control, fast switching
speeds and ability to parallel switching devices.
Reliability screening is available as either TXV or Space
equivalent of MIL-PRF-19500.
Formerly available as type TA45224W.
Symbol
D
G
S
Packaging
TO-205AF
Ordering Information
D
G
S
RAD LEVEL
10K
100K
100K
SCREENING LEVEL
Engineering samples
TXV
Space
PART NUMBER/BRAND
FSGL035D1
FSGL035R3
FSGL035R4
鈥?/div>
Current is limited by the package capability
漏2001 Fairchild Semiconductor Corporation
FSGL035R Rev. B
1
2
3
4
5
6
7
8
