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FSF254R4 Datasheet

  • FSF254R4

  • 18A, 250V, 0.170 Ohm, Rad Hard, SEGR Resistant, N-Channel Po...

  • 8頁

  • INTERSIL   INTERSIL

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FSF254D, FSF254R
June 1998
18A, 250V, 0.170 Ohm, Rad Hard,
SEGR Resistant, N-Channel Power MOSFETs
Description
The Discrete Products Operation of Intersil Corporation has
developed a series of Radiation Hardened MOSFETs specif-
ically designed for commercial and military space applica-
tions. Enhanced Power MOSFET immunity to Single Event
Effects (SEE), Single Event Gate Rupture (SEGR) in particu-
lar, is combined with 100K RADS of total dose hardness to
provide devices which are ideally suited to harsh space envi-
ronments. The dose rate and neutron tolerance necessary
for military applications have not been sacri鏗乧ed.
The Intersil portfolio of SEGR resistant radiation hardened
MOSFETs includes N-Channel and P-Channel devices in a
variety of voltage, current and on-resistance ratings.
Numerous packaging options are also available.
This MOSFET is an enhancement-mode silicon-gate power
鏗乪ld-effect transistor of the vertical DMOS (VDMOS) struc-
ture. It is specially designed and processed to be radiation
tolerant. The MOSFET is well suited for applications
exposed to radiation environments such as switching regula-
tion, switching converters, motor drives, relay drivers and
drivers for high-power bipolar switching transistors requiring
high speed and low gate drive power. This type can be
operated directly from integrated circuits.
Reliability screening is available as either commercial, TXV
equivalent of MIL-S-19500, or Space equivalent of
MIL-S-19500. Contact Intersil for any desired deviations
from the data sheet.
Features
鈥?/div>
18A
,
250V
, r
DS(ON)
=
0.170
鈩?/div>
鈥?Total Dose
- Meets Pre-RAD Speci鏗乧ations to 100K RAD (Si)
鈥?Single Event
- Safe Operating Area Curve for Single Event Effects
- SEE Immunity for LET of 36MeV/mg/cm
2
with
V
DS
up to 80% of Rated Breakdown and
V
GS
of 10V Off-Bias
鈥?Dose Rate
- Typically Survives 3E9 RAD (Si)/s at 80% BV
DSS
- Typically Survives 2E12 if Current Limited to I
DM
鈥?Photo Current
-
15nA
Per-RAD(Si)/s Typically
鈥?Neutron
- Maintain Pre-RAD Speci鏗乧ations
for
1E13
Neutrons/cm
2
- Usable to
1E14
Neutrons/cm
2
Ordering Information
RAD LEVEL SCREENING LEVEL
10K
10K
100K
100K
100K
Commercial
TXV
Commercial
TXV
Space
PART NUMBER/BRAND
FSF254D1
FSF254D3
FSF254R1
FSF254R3
FSF254R4
Symbol
D
G
Formerly available as type TA17658.
S
Package
TO-254AA
G
S
D
CAUTION: Beryllia Warning per MIL-S-19500
refer to package speci鏗乧ations.
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
|
Copyright
Intersil Corporation 1999
File Number
3972.3
3-113

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    INTERSIL [...
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    INTERSIL
  • 英文版
    24A, 200V, 0.110 Ohm, Rad Hard, SEGR Resistant, N-Channel Po...
    INTERSIL [...
  • 英文版
    24A, 200V, 0.110 Ohm, Rad Hard, SEGR Resistant, N-Channel Po...
    INTERSIL
  • 英文版
    24A, 200V, 0.110 Ohm, Rad Hard, SEGR Resistant, N-Channel Po...
    INTERSIL [...
  • 英文版
    24A, 200V, 0.110 Ohm, Rad Hard, SEGR Resistant, N-Channel Po...
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  • 英文版
    24A, 200V, 0.110 Ohm, Rad Hard, SEGR Resistant, N-Channel Po...
    INTERSIL [...
  • 英文版
    24A, 200V, 0.110 Ohm, Rad Hard, SEGR Resistant, N-Channel Po...
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