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EBE11UD8ABFA-5C-E Datasheet

  • EBE11UD8ABFA-5C-E

  • 1GB Unbuffered DDR2 SDRAM DIMM (128M words x 64 bits, 2 Rank...

  • 172.49KB

  • 22頁

  • ELPIDA

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DATA SHEET
1GB Unbuffered DDR2 SDRAM DIMM
EBE11UD8ABFA
(128M words
脳
64 bits, 2 Ranks)
Description
The EBE11UD8ABFA is 128M words
脳
64 bits, 2 ranks
DDR2 SDRAM unbuffered module, mounting 16 pieces
of 512M bits DDR2 SDRAM sealed in FBGA (碌BGA
錚?/div>
)
package. Read and write operations are performed at
the cross points of the CK and the /CK. This high-
speed data transfer is realized by the 4 bits prefetch-
pipelined architecture. Data strobe (DQS and /DQS)
both for read and write are available for high speed and
reliable data bus design. By setting extended mode
register, the on-chip Delay Locked Loop (DLL) can be
set enable or disable. This module provides high
density mounting without utilizing surface mount
technology.
Decoupling capacitors are mounted
beside each FBGA (碌BGA) on the module board.
Note: Do not push the components or drop the
modules in order to avoid mechanical defects,
which may result in electrical defects.
Features
鈥?/div>
240-pin socket type dual in line memory module
(DIMM)
錚?/div>
PCB height: 30.0mm
錚?/div>
Lead pitch: 1.0mm
錚?/div>
Lead-free
鈥?/div>
1.8V power supply
鈥?/div>
Data rate: 533Mbps/400Mbps (max.)
鈥?/div>
1.8V (SSTL_18 compatible) I/O
鈥?/div>
Double-data-rate architecture: two data transfers per
clock cycle
鈥?/div>
Bi-directional, differential data strobe (DQS and
/DQS) is transmitted/received with data, to be used in
capturing data at the receiver
鈥?/div>
DQS is edge aligned with data for READs: center-
aligned with data for WRITEs
鈥?/div>
Differential clock inputs (CK and /CK)
鈥?/div>
DLL aligns DQ and DQS transitions with CK
transitions
鈥?/div>
Commands entered on each positive CK edge: data
and data mask referenced to both edges of DQS
鈥?/div>
Four internal banks for concurrent operation
(Component)
鈥?/div>
Data mask (DM) for write data
鈥?/div>
Burst lengths: 4, 8
鈥?/div>
/CAS Latency (CL): 3, 4, 5
鈥?/div>
Auto precharge operation for each burst access
鈥?/div>
Auto refresh and self refresh modes
鈥?/div>
7.8碌s average periodic refresh interval
鈥?/div>
Posted CAS by programmable additive latency for
better command and data bus efficiency
鈥?/div>
Off-Chip-Driver Impedance Adjustment and On-Die-
Termination for better signal quality
鈥?/div>
/DQS can be disabled for single-ended Data Strobe
operation
Document No. E0365E50 (Ver. 5.0)
Date Published August 2004 (K) Japan
URL: http://www.elpida.com
錚〦lpida
Memory, Inc. 2003-2004

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