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DS2174QN Datasheet

  • DS2174QN

  • EBERT

  • 24頁(yè)

  • MAXIM   MAXIM

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DS2174
EBERT
www.maxim-ic.com
FEATURES
摟
摟
Generates and detects digital patterns for
analyzing and trouble-shooting digital
communications systems
Programmable polynomial length and
feedback taps for generation of any
pseudorandom patterns up to 2
32
- 1; up to 32
taps can be used in the feedback path
Programmable, user-defined pattern registers
for long repetitive patterns up to 512 bytes in
length
Large 48-bit count and bit error count registers
Software-programmable bit error insertion
Fully independent transmit and receive paths
8-bit parallel-control port
Detects polynomial test patterns in the
presence of bit error rates up to 10
-2
Programmable for serial, 4-bit parallel, or 8-bit
parallel data interfaces
Serial mode clock rate is 155MHz; byte mode
is 80MHz for a net 622Mbps; OC-3
Available in 44-pin PLCC
PIN ASSIGNMENT
RDAT2
RDAT1
RDAT0
RCLK_EN
RCLK
VDD
D7
D6
D5
D4
D3
RDAT3
RDAT4
RDAT5
RDAT6
RDAT7
GND
A0
A1
A2
A3
CS
7
8
9
10
11
12
13
14
15
16
17
6
5
4
3
2
1
44
43
42
41
40
摟
摟
摟
摟
摟
摟
摟
摟
摟
DS2174
39
38
37
36
35
34
33
32
31
30
29
D2
D1
D0
TDAT7
TDAT6
GND
TDAT5
TDAT4
TDAT3
TDAT2
GND
APPLICATIONS
摟
摟
摟
摟
摟
摟
摟
摟
摟
Routers
Channel Service Units (CSUs)
Data Service Units (DSUs)
Muxes
Switches
Digital-to-Analog Converters (DACs)
CPE Equipment
Bridges
Smart Jack
ORDERING INFORMATION
DS2174Q
DS2174QN
44-Pin PLCC 0擄C to +70擄C
44-Pin PLCC -40擄C to +85擄C
DESCRIPTION
The DS2174 enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator,
receiver, and analyzer capable of meeting the most stringent error-performance requir ements of digital
transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and
generates and uniquely synchronizes to pseudorandom patterns of the form 2
n
- 1, where n can take on
values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.
Note:
Some revisions of this device may incorporate deviations from published specifications known as errata. Multiple
revisions of any device may be simultaneously available through various sales channels. For information about device errata,
click here:
http://www.maxim-ic.com/errata.
1 of 24
050202
RD
WR
TEST
TEST
GND
VDD
TCLK
TCLK_EN
TCLKO
TDAT0
TDAT1
18
19
20
21
22
23
24
25
26
27
28

DS2174QN 產(chǎn)品屬性

  • Maxim Integrated Products

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