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BQ2203ASNN Datasheet

  • BQ2203ASNN

  • NV Controller With Battery Monitor

  • 83.51KB

  • 12頁(yè)

  • TI

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bq2203A
NV Controller With Battery Monitor
Features
General Description
The CMOS bq2203A SRAM Nonvolatile
Controller With Battery Monitor pro-
vides all the necessary functions for con-
verting one or two banks of standard
CMOS SRAM into nonvolatile
read/write memory. The bq2203A is
compatible with the Personal Computer
Memory Card International Association
(PCMCIA) recommendations for
battery-backed static RAM memory
cards.
A precision comparator monitors the 5V
V
CC
input for an out-of-tolerance condi-
tion. When out of tolerance is detected,
the two conditioned chip-enable outputs
are forced inactive to write-protect
banks of SRAM.
Power monitoring and switching
for nonvolatile control of SRAMs
Write-protect control
Battery-low and battery-fail indi-
cators
Reset output for system power-on
reset
Input decoder for control of up to
2 banks of SRAM
3-volt primary cell input
3-volt rechargeable battery in-
put/output
Power for the external SRAMs is
switched from the V
CC
supply to the
battery-backup supply as V
CC
de-
cays. On a subsequent power-up, the
V
OUT
supply is automatically
switched from the backup supply to
the V
CC
supply. The external SRAMs
are write-protected until a power-
valid condition exists. The reset out-
put provides power-fail and power-on
resets for the system. The battery
monitor indicates battery-low and
battery-fail conditions.
During power-valid operation, the
input decoder selects one of two
banks of SRAM.
Pin Connections
VOUT
BCP
NC
A
BCF
NC
THS
VSS
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
VCC
BCS
CE
CECON1
CECON2
BCL
RST
NC
Pin Names
V
OUT
RST
THS
CE
CE
CON1
,
CE
CON2
A
BCF
BCL
BC
P
BC
S
NC
V
CC
V
SS
Supply output
Reset output
Threshold select input
chip-enable active low input
Conditioned chip-enable outputs
Bank select input
Battery fail push-pull output
Battery low push-pull output
3V backup supply input
3V rechargeable backup supply input/output
No connect
5-volt supply input
Ground
16-Pin Narrow DIP or SOIC
PN220301.eps
Functional Description
Two banks of CMOS static RAM can be battery-backed us-
ing the V
OUT
and the conditioned chip-enable output pins
from the bq2203A. As the voltage input V
CC
slews down
during a power failure, the two conditioned chip-enable
outputs, CE
CON1
and CE
CON2
, are forced inactive
independent of the chip-enable input CE.
This activity unconditionally write-protects external SRAM
as V
CC
falls to an out-of-tolerance threshold V
PFD
. V
PFD
is
selected by the threshold select input pin, THS. If THS is
tied to V
SS
, the power-fail detection occurs at 4.62V typical
for 5% supply operation.
Nov. 1994 B
If THS is tied to V
CC
, power-fail detection occurs at
4.37V typical for 10% supply operation. The THS pin
must be tied to V
SS
or V
CC
for proper operation.
If a memory access is in process to any of the two exter-
nal banks of SRAM during power-fail detection, that
memory cycle continues to completion before the memory
is write-protected. If the memory cycle is not terminated
within time t
WPT
(150碌s maximum), the two chip-enable
outputs are unconditionally driven high, write-protecting
the controlled SRAMs.
1

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