ATF1502AE-10 Datasheet

IC型號：
ATF1502AE-10
PDF描述：
2nd Generation EE Complex Programmable Logic Devices
文件大?。?/label>
1561.18KB
PDF頁數(shù)：
76頁
芯片廠家：
ATMEL

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Features

鈥?/div>

2nd Generation EE Complex Programmable Logic Devices

鈥?3.0V to 3.6V Operating Range with 5V Tolerant I/Os

鈥?32 - 512 Macrocells with Enhanced Features

鈥?Pin-compatible with Industry-standard Devices

鈥?Speeds to 4.5 ns Maximum Pin-to-pin Delay

鈥?Registered Operation to 225 MHz

Enhanced Macrocells with Logic Doubling

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Features

鈥?Bury Either Register or COM while Using the Other for Output

鈥?Dual Independent Feedback Allows Multiple Latch Functions per Macrocell

鈥?5 Product Terms per Macrocell, Expandable to 40 per Macrocell with Cascade

Logic, Plus 15 More with Foldback Logic

鈥?D/T/Latch Configurable Flip-flops plus Transparent Latches

鈥?Global and/or per Macrocell Register Control Signals

鈥?Global and/or per Macrocell Output Enable

鈥?Programmable Output Slew Rate per Macrocell

鈥?Programmable Output Open Collector Option per Macrocell

鈥?Fast Registered Input from Product Term

Enhanced Connectivity

鈥?Single Level Switch Matrix for Maximum Routing Options

鈥?Up to 40 Inputs per Logic Block

Advanced Power Management Features

鈥?ITD (Input Transition Detection) Available Individually on Global Clocks, Inputs and

I/O for 碌A(chǔ) Level Standby Current on 鈥淟鈥?versions

鈥?Pin-controlled 1 mA Standby Mode

鈥?Reduced-power Option per Macrocell

鈥?Automatic Power Down of Unused Macrocells

鈥?Programmable Pin-keeper Inputs and I/Os

Available in Commercial and Industrial Temperature Ranges

Available in All Popular Packages Including PLCC, PQFP, TQFP and BGA

EE Technology

鈥?100% Tested

鈥?Completely Reprogrammable

鈥?10,000 Program/Erase Cycles

鈥?20 Year Data Retention

鈥?2000V ESD Protection

鈥?200 mA Latch-up Immunity

JTAG Boundary-scan Testing Port per IEEE 1149.1-1990 and 1149.1a-1993

鈥?Pull-up Option on JTAG Pins TMS and TDI

IEEE 1532 Compatibility for Fast In-System Programmability (ISP) via JTAG

PCI-compliant

Security Fuse Feature

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Preliminary

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Rev. 2398E鈥?2/01

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