MILITARY DATA SHEET
MN54F10-X REV 1A0
TRIPLE 3 INPUT NAND GATE
General Description
This device contains four independent gates, each of which performs the logic NAND
function.
Original Creation Date: 03/07/96
Last Update Date: 07/30/96
Last Major Revision Date: 03/07/96
Industry Part Number
54F10
NS Part Numbers
54F10DMQB
54F10FMQB
54F10LMQB
Prime Die
M010
Processing
MIL-STD-883, Method 5004
Subgrp Description
1
2
3
4
5
6
7
8A
8B
9
10
11
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temp (
o
C)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
Quality Conformance Inspection
MIL-STD-883, Method 5005
1