鈥?/div>
High Avalanche Capability Ratings
QUALITY GRADE
Standard
Please refer to "Quality grade on NEC Semiconductor Devices" (Document
number IEI-1209) published by NEC Corporation to know the
specification of quality grade on the devices and its recommended applica-
tions.
6.0
MAX.
0.5 鹵0.2
2.8 鹵0.2
2.54
1. Gate
2. Drain
3. Source
4. Fin (Drain)
JEDEC: TO-220AB
MP-25 (TO-220)
(10.0)
4
4.8
MAX.
8.5 鹵0.2
1.3 鹵0.2
ABSOLUTE MAXIMUM RATINGS (T
A
= 25 藲C)
Drain to Source Voltage
Gate to Source Voltage
Drain Current (DC)
Drain Current (pulse)*
Total Power Dissipation (T
c
= 25 藲C)
Total Power Dissipation (T
A
= 25 藲C)
Channel Temperature
Storage Temperature
Single Avalanche Current**
Single Avalanche Energy**
*
PW
鈮?/div>
10
碌
s, Duty Cycle
鈮?/div>
1 %
V
DSS
V
GSS
I
D(DC)
I
D(pulse)
P
T1
P
T2
T
ch
T
stg
I
AS
E
AS
60
鹵20
鹵30
鹵120
75
1.5
150
30
90
V
V
A
A
W
擄C
A
mJ
W
1.0
鹵
0.5
1.5
MAX.
1.4 鹵0.2
1.0 鹵0.3
(2.54) (2.54)
1 2 3
1.1 鹵0.4
3.0 鹵0.5
R)
.5 )
(0 .8R
(0
0.5 鹵0.2
鈥?5 to +150
擄C
MP-25Z(SURFACE MOUNT TYPE)
Drain
2.8 鹵0.2
**
Starting T
ch
= 25 藲C, R
G
= 25
鈩?
V
GS
= 20 V
鈫?/div>
0
Gate
Body
Diode
Gate Protection
Diode
Source
The information in this document is subject to change without notice.
Document No. D13398EJ1V0DS00 (1st edition)
(Previous No. TC-2492)
Date Published March 1998 N CP(K)
Printed in Japan
漏
1994
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